The paper “Localized patterns“, co-authored by Jason Bramburger (Concordia University, Canada), Dan Hill (Universitat des Saarlandes, Germany), and David Lloyd, has been accepted for publication in SIAM Review. The paper reviews recent advances regarding the complex behavior of localized patterns and the mathematical tools that have been developed to understand them, covering various topics from spatial dynamics, exponential asymptotics, and numerical methods, with emphasis on patterns in two and three spatial dimensions. The journal is SIAM’s flagship journal which is sent to all 14,000 SIAM members worldwide. The final-form manuscript is available on the arXiv (link here). The screenshot below shows Figure 38 from the paper.